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Cita APA (7a ed.)
Christien, F., Ferchaud, E., Nowakowski, P., & Allart, M. (2012). The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen. https://doi.org/10.5772/28877
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Cita Chicago Style (17a ed.)
Christien, Frédéric, Edouard Ferchaud, Pawel Nowakowski, y Marion Allart. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen, 2012. https://doi.org/10.5772/28877.
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Cita MLA (9a ed.)
Christien, Frédéric, et al. The Use of Electron Probe MicroAnalysis to Determine the Thickness of Thin Films in Materials Science. IntechOpen, 2012. https://doi.org/10.5772/28877.
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