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APA (7th ed.) Citation
Kosemura, D., Tomita, M., Usuda, K., & Ogura, A. (2012). Stress Measurements in Si and SiGe by Liquid-Immersion Raman Spectroscopy. IntechOpen. https://doi.org/10.5772/47831
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Chicago Style (17th ed.) Citation
Kosemura, Daisuke, Motohiro Tomita, Koji Usuda, and Atsushi Ogura. Stress Measurements in Si and SiGe by Liquid-Immersion Raman Spectroscopy. IntechOpen, 2012. https://doi.org/10.5772/47831.
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MLA (9th ed.) Citation
Kosemura, Daisuke, et al. Stress Measurements in Si and SiGe by Liquid-Immersion Raman Spectroscopy. IntechOpen, 2012. https://doi.org/10.5772/47831.
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Warning: These citations may not always be 100% accurate.