Registro de Citas
Cita APA (7a ed.)
Wang, W., Reddy, V., Balakrishnan, V., Krishnan, S., & Cao, Y. (2010). Statistical Prediction of Circuit Aging under Process Variations. IntechOpen. https://doi.org/10.5772/6875
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Cita Chicago Style (17a ed.)
Wang, Wenping, Vijay Reddy, Varsha Balakrishnan, Srikanth Krishnan, y Yu Cao. Statistical Prediction of Circuit Aging Under Process Variations. IntechOpen, 2010. https://doi.org/10.5772/6875.
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Cita MLA (9a ed.)
Wang, Wenping, et al. Statistical Prediction of Circuit Aging Under Process Variations. IntechOpen, 2010. https://doi.org/10.5772/6875.
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