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Cita APA (7a ed.)
Yu, G., & Li, P. (2010). Robust Design and Test of Analog/Mixed-Signal Circuits in Deeply Scaled CMOS Technologies. IntechOpen. https://doi.org/10.5772/8256
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Cita Chicago Style (17a ed.)
Yu, Guo, y Peng Li. Robust Design and Test of Analog/Mixed-Signal Circuits in Deeply Scaled CMOS Technologies. IntechOpen, 2010. https://doi.org/10.5772/8256.
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Cita MLA (9a ed.)
Yu, Guo, y Peng Li. Robust Design and Test of Analog/Mixed-Signal Circuits in Deeply Scaled CMOS Technologies. IntechOpen, 2010. https://doi.org/10.5772/8256.
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