Pattern Recognition based Fault Diagnosis in Industrial Processes: Review and Application

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Detalles Bibliográficos
Autores principales:	Rauber, Thomas W., Nascimento, Eduardo Mendel do, Wandekokem, Estefhan D., Varejao, Flavio M.
Formato:	Capítulo de libro
Lenguaje:	inglés
Publicado:	IntechOpen 2010
Materias:	Physical Sciences, Engineering and Technology
Acceso en línea:	https://www.intechopen.com/chapters/10675
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