Cathodoluminescent Properties of Thin Silicon Films Deposited on Nanoscopic Cerium Dioxide Buffer Layer
<p id="p1">Luminescent properties of silicon films deposited on glass substrate and cerium dioxide were investigated. Recombination of carriers through the defect or surface states was observed. Point defects were studied by using electron paramagnetic resonance spectroscopy. The crystal phase was t...
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| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
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IntechOpen
2025
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| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/1197471 |
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