Development and Application of a Terahertz Measuring System for Dielectric Characterization
<p id="p1">This study investigates the development and implementation of a system utilizing a gas laser for measuring dielectric characteristics within the terahertz frequency range. Methodological aspects include signal modulation using a shutter for enhanced radiometric reception and the integrati...
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| Autores principales: | , , , |
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| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2025
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| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/1203751 |
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| Sumario: | <p id="p1">This study investigates the development and implementation of a system utilizing a gas laser for measuring dielectric characteristics within the terahertz frequency range. Methodological aspects include signal modulation using a shutter for enhanced radiometric reception and the integration of a reference channel to stabilize measurements against fluctuations in emitted power. Techniques for background compensation in both measurement and calibration channels are detailed, crucial for extending the dynamic range of attenuation measurements across diverse dielectric materials. Experimental results reveal linear attenuation coefficients for various materials, ranging from low values for polystyrene variants to significantly higher values for materials such as Getinax and organic glass. The findings underscore the feasibility of utilizing different dielectrics in terahertz applications based on their transparency coefficients.</p> |
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| ISBN: | 978-1-83634-113-0 |
| DOI: | 10.5772/intechopen.1007465 |