Self-Heating Effects in Nanoscale MOSFETs
<p id="p1">The ongoing miniaturization of metal-oxide-semiconductor field-effect transistors (MOSFETs) remains a central focus in the advancement of nanoelectronic technologies. As device dimensions continue to shrink into the nanometer scale, various reliability and degradation phenomena become inc...
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| Autores principales: | , , |
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| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2025
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| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/1226355 |
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