Randomized Algorithm-Based Optimization of Next-Generation Field-Effect Transistors: Design, Variability, and Performance Innovations

<p id="p1">The ongoing scaling of field-effect transistors (FETs) to nano-scale dimensions poses completely new problems of device optimization, variability management, and performance optimization. The chapter will introduce a general framework of randomized algorithm-based optimization of next-gen...

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Autores principales:	Srikanth, Mandela, Dosanapudi, Uday Kumar, Bokka, Revanth
Formato:	Capítulo de libro
Lenguaje:	inglés
Publicado:	IntechOpen 2025
Materias:	Physical Sciences, Engineering and Technology
Acceso en línea:	https://www.intechopen.com/chapters/1234372
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