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Cita APA (7a ed.)
Benavente, J., & Rodríguez-Castellón, E. (2011). Application of Electrochemical Impedance Spectroscopy (EIS) and X-Ray Photoelectron Spectroscopy (XPS) to the Characterization of RTILs for Electrochemical Applications. IntechOpen. https://doi.org/10.5772/15704
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Cita Chicago Style (17a ed.)
Benavente, J., y E. Rodríguez-Castellón. Application of Electrochemical Impedance Spectroscopy (EIS) and X-Ray Photoelectron Spectroscopy (XPS) to the Characterization of RTILs for Electrochemical Applications. IntechOpen, 2011. https://doi.org/10.5772/15704.
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Cita MLA (9a ed.)
Benavente, J., y E. Rodríguez-Castellón. Application of Electrochemical Impedance Spectroscopy (EIS) and X-Ray Photoelectron Spectroscopy (XPS) to the Characterization of RTILs for Electrochemical Applications. IntechOpen, 2011. https://doi.org/10.5772/15704.
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