Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering
None
Guardado en:
| Autores principales: | , , , , |
|---|---|
| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2011
|
| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/14161 |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares: Detection and Characterization of Nano-Defects Located on Micro-Structured Substrates by Means of Light Scattering
- Femtosecond Laser Micro-/Nano-Texturing to Die Substrates for Fine Imprinting to Products
- Impact of Defect Structure on ’Bulk’ and Nano-Scale Ferroelectrics
- Micro/nano replication : processes and applications /
- Haptics in Micro- and Nano-Manipulation
- Computational Modeling of Light Scattering in Polymer Nanoparticles for Optical Characterization
- Nano/Micro-Structured Materials: Synthesis, Morphology and Applications