Photoconductors for Measuring Speckle Motion to Monitor Ultrasonic Vibrations
None
Guardado en:
| Autores principales: | , |
|---|---|
| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2012
|
| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/33522 |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares: Photoconductors for Measuring Speckle Motion to Monitor Ultrasonic Vibrations
- Vibration Measurement by Speckle Interferometry between High Spatial and High Temporal Resolution
- High Sensitivity Uncooled InAsSb Photoconductors with Long Wavelength
- Effect of Applying Ultrasonic Vibration in Hot Embossing and Nanoimprint
- Speckle Interferometry for Displacement Measurement and Hybrid Stress Analysis
- Overview of Nonlinear Optics
- Ultrasonic and Spectroscopic Techniques for the Measurement of the Elastic Properties of Nanoscale Materials