Fault Tolerance in Carbon Nanotube Transistors Based Multi Valued Logic

This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method f...

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Autor principal: Sundararajan, Gopalakrishnan
Formato: Capítulo de libro
Lenguaje:inglés
Publicado: IntechOpen 2021
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Acceso en línea:https://www.intechopen.com/chapters/74683
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Sumario:This Chapter presents a solution for fault-tolerance in Multi-Valued Logic (MVL) circuits comprised of Carbon Nano-Tube Field Effect Transistors (CNTFET). This chapter reviews basic primitives of MVL and describes ternary implementations of CNTFET circuits. Finally, this chapter describes a method for error correction called Restorative Feedback (RFB). The RFB method is a variant of Triple-Modular Redundancy (TMR) that utilizes the fault masking capabilities of the Muller C element to provide added protection against noisy transient faults. Fault tolerant properties of Muller C element is discussed and error correction capability of RFB method is demonstrated in detail.
ISBN:978-1-83881-184-6
DOI:10.5772/intechopen.95361