Nanomaterials Characterisation through Magnetic Field Dependent AFM
Atomic force microscopy is a versatile technique allowing to exploit many different physical effects for measuring a number of materials properties. The magnetic properties of surfaces and thin films are traditionally accessed through magnetic force microscopy, which produces magnetic field gradient...
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| Autores principales: | , , , |
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| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2021
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| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/76300 |
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