Application of Atomic Force Microscopy in Organic and Perovskite Photovoltaics

Atomic force microscopy (AFM) has become widely used technique in air, liquids, or vacuum to generate high-resolution topographic images of a surface having a nanometer-scale resolution. AFM gives the information about the morphology, phase composition etc. Photovoltaic materials have been attractin...

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Detalles Bibliográficos

Autor principal:	Pathak, Chandra Shakher
Formato:	Capítulo de libro
Lenguaje:	inglés
Publicado:	IntechOpen 2021
Materias:	Physical Sciences, Engineering and Technology
Acceso en línea:	https://www.intechopen.com/chapters/77132
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