Retracted: Scanning Electron Microscopy
Scanning electron microscopy (SEM) is the most preferred method in microstructural analysis today. In this method, electrons accelerated by high voltage (0-30 kV) are focused on the sample. During the scanning of the surface of this focused electron beam, electrons and material atoms interact. Elect...
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| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2022
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| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/81119 |
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