Aproximación de Parámetros Físicos en Silicio Poroso Infiltrado con Óxido de Titanio

Titanium oxide infiltrated in porous silicon system is studied using infrared spectroscopy (FTIR), photoluminescence (FL), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDS). The results of characterization and a model proposed in the literature, the parameters of mat...

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Bibliographic Details

Main Authors:	Nieto Caballero, Fabiola Gabriela, Romano Trujillo, Roman, Garcia Jiménez, Miguel, Rosendo Andres, Enrique, Sanchez Padilla, Minerva
Format:	Article
Language:	Spanish
Published:	2024
Subjects:	porous silicon electrolysis titanium SiH SiO silicio poroso electrólisis óxido de titanio
Online Access:	https://dialnet.unirioja.es/servlet/oaiart?codigo=9481489
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