Radiation Hardness of Semiconductor Programmable Memories and Over-Voltage Protection Components
None
Guardado en:
| Autores principales: | , , , |
|---|---|
| Formato: | Capítulo de libro |
| Lenguaje: | inglés |
| Publicado: |
IntechOpen
2009
|
| Materias: | |
| Acceso en línea: | https://www.intechopen.com/chapters/6639 |
| Etiquetas: |
Sin Etiquetas, Sea el primero en etiquetar este registro!
|
Ejemplares similares: Radiation Hardness of Semiconductor Programmable Memories and Over-Voltage Protection Components
- Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors
- Characterization of Thin Films for Solar Cells and Photodetectors and Possibilities for Improvement of Solar Cells Characteristics
- Radiation Hardness of Flash and Nanoparticle Memories
- Influencers and the Giant Component: the Fundamental Hardness in Privacy Protection for Socially Contagious Attributes
- Ethical Values in Radiation Protection
- State of Radiation Protection in Bulgaria