Chemical Mechanical Planarization-Related to Contaminants: Their Sources and Characteristics

Chemical mechanical planarization (CMP) process has been widely used to planarize a variety of materials including dielectrics, metal, and semiconductors in Si-based semiconductor devices. It is one of the most critical steps to achieve the nanolevel wafer and die scale planarity. However, various c...

Descripción completa

Guardado en:
Detalles Bibliográficos
Autor principal: Seo, Jihoon
Formato: Capítulo de libro
Lenguaje:inglés
Publicado: IntechOpen 2020
Materias:
Acceso en línea:https://www.intechopen.com/chapters/73793
Etiquetas: Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!