Robust Design and Test of Analog/Mixed-Signal Circuits in Deeply Scaled CMOS Technologies

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Detalles Bibliográficos
Autores principales:	Yu, Guo, Li, Peng
Formato:	Capítulo de libro
Lenguaje:	inglés
Publicado:	IntechOpen 2010
Materias:	Physical Sciences, Engineering and Technology
Acceso en línea:	https://www.intechopen.com/chapters/9459
Etiquetas:	Agregar Etiqueta Sin Etiquetas, Sea el primero en etiquetar este registro!

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