Advanced Electron Microscopy Techniques on Semiconductor Nanowires: from Atomic Density of States Analysis to 3D Reconstruction Models
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| Main Authors: | , , , , , , , |
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| Format: | Book Chapter |
| Language: | English |
| Published: |
IntechOpen
2010
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| Subjects: | |
| Online Access: | https://www.intechopen.com/chapters/10519 |
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